Molded Underfilling for Package on Package Devices

ABSTRACT

Presented herein are a package-on-package device having a molded underfill and a method for forming the same, the method comprising applying a package mount mounting a die to the first side of a carrier package. A molded underfill may be applied first side of the carrier package, and be in contact with a portion of the package mount a portion of a sidewall of the die. A top package having at least one land may be mounted to the first side of the carrier package above the die, and, optionally separated from the top of the die. The package mount may be coined prior to, during or after applying the molded underfill to optionally be level with the underfill surface. The underfill region contacting the package mount may be below or above the surface of the underfill region contacting the die sidewall.

This application is a divisional application of and claims priority toU.S. patent application Ser. No. 13/667,060, filed on Nov. 2, 2012,entitled “Molded Underfilling for Package on Package Devices,” whichapplication is incorporated herein in its entirety.

BACKGROUND

Semiconductor devices are used in a variety of electronic applications,such as personal computers, cell phones, digital cameras, and otherelectronic equipment, as examples. Semiconductor devices are typicallyfabricated by sequentially depositing insulating or dielectric layers,conductive layers, and semiconductor layers of material over asemiconductor substrate, and patterning the various material layersusing lithography to form circuit components and elements thereon.

The semiconductor industry continues to improve the integration densityof various electronic components (e.g., transistors, diodes, resistors,capacitors, etc.) by continual reductions in minimum feature size, whichallow more components to be integrated into a given area. These smallerelectronic components also require smaller packages that utilize lessarea than packages of the past, in some applications.

Package on package (PoP) technology is becoming increasingly popular forits ability to allow for denser integration of integrated circuits intoa small overall package. PoP technology is employed in many advancedhandheld devices, such as smart phones. While PoP technology has allowedfor a lower package profile, the total thickness reduction is currentlylimited by the solder ball joint height between the top package andbottom package. Dies are sometimes mounted to an interposer substrate orother packaging carrier via a ball grid array, land array, solidinterposer stud array, or the like. In some instances, an undermountfiller or underfill may be applied between the die and the interposer PCboard to fill the spaces between the mounting conductors.

BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding of the present disclosure, and theadvantages thereof, reference is now made to the following descriptionstaken in conjunction with the accompanying drawings, in which:

FIG. 1 shows a flow diagram illustrating a method for forming apackage-on-package device with a molded underfilling;

FIGS. 2 through 7 illustrate cross-sectional views of intermediate stepsin forming an embodiment of a package-on-package device with a moldedunderfilling;

FIGS. 8A through 8D and 9A through 9D illustrate embodiments of methodsfor forming a package-on-package device with a molded underfilling; and

FIGS. 10-13 illustrate cross-sectional views of embodiments of apackage-on-package device with a molded underfilling.

Corresponding numerals and symbols in the different figures generallyrefer to corresponding parts unless otherwise indicated. The figures aredrawn to illustrate the relevant aspects of the embodiments and are notnecessarily drawn to scale.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

The making and using of the embodiments of the present disclosure arediscussed in detail below. It should be appreciated, however, that thepresent disclosure provides many applicable concepts that can beembodied in a wide variety of specific contexts. The specificembodiments discussed are merely illustrative of specific ways to makeand use the disclosure, and do not limit the scope of the disclosure.Note that, for simplification, not all element numbers are included ineach subsequent drawing. Rather, the element numbers most pertinent tothe description of each drawing are included in each of the drawings.

FIG. 1 shows a flow diagram illustrating a method 100 for forming a PoPdevice with a molded underfilling in accordance with an embodiment ofthe present disclosure. Referring first to FIG. 1, an interposerpreparation procedure 102 and mold preparation procedure 104 areperformed prior to a top package mounting procedure 106. FIG. 2illustrates a carrier package 200. In the interposer preparationprocedure 102, a carrier package 200 is provided in block 108, and diemounts 202, package mounts 204 and one or more dies 402 (see FIG. 4) areapplied to a carrier package 200. While one carrier package 200 is shownin the drawings, several carrier packages 200 may optionally beprocessed on a workpiece comprising a plurality of carrier packages 200,and the workpiece may be singulated during a subsequent process step.

The carrier package 200 may have an interposer substrate 206 with one ormore redistribution layers (RDLs) 208 disposed on one or both sides ofthe interposer substrate 206. The interposer substrate 206 may havesubstrate lands 216 on one or both sides, with the substrate lands 216connected by through vias 218. The RDLs 208 may comprise one or moremounting pads or lands 210 which may be electrically connected to thesubstrate lands 216 of the interposer substrate, and by extension, tothe vias 218.

Another embodiment may be where the carrier package 200 has an RDL 208on the side of the interposer substrate 206 opposite the die mounts 202.The RDL 208 may have one or more lands 210 with PoP mounts 212, such asa ball grid array, or the like, that may allow the final PoP device tobe mounted to another package, board, device, display, or the like.

Mounting points may be applied to the carrier package 200 in block 110.Referring back to FIG. 2, mounting points such as package mounts 204 anddie mounts 202 may be disposed on the lands 210. In some embodiments,the package mounts 204 and/or the die mounts 202 are solder balls.Alternatively the die mounts 202 and package mounts 204 may be solidinterconnects, or another package mounting apparatus. One or moresurface vias 214 may be electrically connected to the lands 210, whichare in turn connected to the substrate lands 216 and through vias 218.In some embodiments, the mounting points, as shown by the package mounts204, may be disposed directly on the lands 210, or on a surface via 214as illustrated by the die mounts 202.

The die mounts 202 and package mounts 204 may optionally be coined, ortrimmed, in block 112, and as illustrated in FIG. 3. In someembodiments, solder balls may be applied in block 110, and then coinedonce solidified in block 112. In some embodiments, coining the packagemounts 204 or the die mounts 202 may comprise creating a substantiallyflat top surface on the package mounts 204 or the die mounts 202. Insome embodiments, the flat coined surface or flat top section may beformed on the package mount 204 or die mount opposite the carrierpackage 200. As shown in FIG. 3, the package mounts 204 and die mounts202 may be coined or trimmed at a single plane 302 to a predeterminedheight above the surface of the carrier package 200. In otherembodiments, the package mounts 204 may be coined at a first plane to afirst height, and the die mounts 202 may be coined at a second plane toa second, different height. Additionally, the first, package mount 204height may be higher than the second, die mount 202 height, oralternatively, the first, package mount 204 height may be lower than thesecond, die mount 202 height. In other embodiments, the die mounts 202may remain untrimmed, without coining, while the package mounts 204 maybe coined to a predetermined height.

One or more dies 402 may be mounted on the die mounts 202 in block 114,as illustrated in FIG. 4. While FIG. 4 illustrates the mounting of asingle die 402 for clarity, any number of dies 402 may be mounted to thedie mounts 202. In embodiments where multiple dies 402 are to be mountedto the die mounts 202, the die mounts 202 may be configured in groups toaccept the multiple dies 402.

The dies 402 may be mounted to the die mounts by attaching a die land404 or other mounting pad to the die mounts 202. In embodiments wherethe die mounts 202 are solder balls, the solder ball die mounts 202 maybe reflowed to attach the die mounts 202 to the die lands 404. In otherembodiments, the die 402 may be temporarily mounted to the die mounts202 via solder paste, a conductive adhesive, or the like, and the solderreflowed at a subsequent step to permanently mount the die 402 to thedie mounts 202. In yet other embodiments, where the die mounts 202 are asolid interconnect, or other non-solder material, the die 402 may beattached to the solid interconnect with solder, solder paste or anotherconductive adhesive material.

In a mold preparation procedure 104, a mold 502 may be provided in block116 as shown in FIG. 5. A release film 504 may be optionally applied inblock 118. The mold 502 may have a border or other feature for retainingunderfilling material when applied. The mold 502, may, in someembodiments, be configured to accept one or more carrier packages 200with dies 402, and recesses may be formed in the mold 502 to direct orform an underfilling (506 of FIG. 5) around the die 402, the die mounts202, the package mounts 204 and the surface of the carrier package 200.

In a top package mounting procedure 106, a molded underfill (MUF) 506may be applied to the carrier package 200, and may fill the area underthe die 402, between the die mounts 202 and the area around the packagemounts 204. In some embodiments, the MUF 506 may be a nonconductivematerial, and may be an epoxy, a resin, a moldable polymer, or the like.The MUF 506 may be applied while substantially liquid, and then may becured through a chemical reaction, such as in an epoxy or resin. Inother embodiments, the MUF 506 may be an ultraviolet (UV) or thermallycured polymer applied as a gel or malleable solid capable of beingdisposed between the die 402 and RDL 208 surface. In an embodimentemploying material requiring UV or thermal energy to cure the MUF 506,the MUF 506 material may be molded into place, but may remain firmenough for the mold to be removed to expose the MUF 506 to UV or athermal energy source for curing. The optional application of therelease film 504 in block 118 may permit parting of the mold 502 fromthe MUF 506, and may be used in embodiments where the MUF 506 is anepoxy or resin to prevent the MUF 506 material from adhering to the mold502 surface.

The mounts may optionally be coined in block 124. In particular, thepackage mounts 204 may be coined during molding of the underfill inblock 122, or after the MUF 506 is formed. In some embodiments, the mold502 may trim the package mounts 204 while applying the MUF 506. Forexample, the mold 502 may be heated to the point where excess materialof package mounts 204 made of solder may be removed. Alternatively, asecond mold patterned the same as the first mold 502, but with anabrasive disposed inside, may be used to abrade the package mounts 204to a desired height after the MUF 506 is formed. In another embodiment,the MUF 506 may be applied so that the uncoined package mounts 204extend above the surface of the MUF 506, and then the package mounts maybe trimmed to substantially level with the top surface of the MUF 506region surrounding the package mounts 204.

The MUF 506 may be applied, by, for example, injecting an epoxy of otherflowable material into the MUF 506 space. In such embodiments, the mold502 may have one or more injection ports through which the MUF 506 isinjected. The mold 502 may have a border structure that retains the MUF506 at the edge of the carrier package 200, or may contain the MUF 506to a predefined area on the carrier package 200. In such an embodiment,the MUF 506 may be applied under pressure to force the MUF 506 materialinto the spaces between the package mounts 204 and under the die 402 andbetween the die mounts 202. In other embodiments, the mold 502 may befilled with the MUF 506 material, and the carrier package 200 placedinto the mold. In some embodiments, the mold 502 may be upside down;with the carrier package 200 placed upside down into an MUF 506 materialin the mold 502.

The MUF 506 may have one or more subregions, and may comprise a diesidewall MUF region 506B and a package mount MUF region 506A. The MUF506 region surrounding the package mounts may be the package mount MUFregion 506A, and MUF 506 may be applied so that the top surface of theMUF 506 is at substantially the same height as, or substantially levelwith, the coined surfaces of the package mounts 204. Alternatively, theMUF 506 may be applied and the package mounts 204 coined afterwards sothat the coined, or top, surface of the package mounts 204 issubstantially level with the top surface of the package mount MUF region506A. The package mount MUF region 506A may at least partially enclosethe package mounts 204 such that the package mounts 204 are at leastpartially disposed within the package mount MUF region 506A.

In the illustrated embodiment, the top surface of the package mount MUFregion 506A may be lower than the top surface of the die 402, andsubstantially the same level as the top surface of the package mounts204. The die sidewall MUF region 506B may cover at least a portion ofthe die 402 sidewall. In some embodiments, the die sidewall MUF region506B may rise to about the top surface of the die 402 and be adhered tothe die 402 sidewalls. While the die sidewall MUF region 506B isillustrated herein as having a substantially vertical external sidewall506C, the angle of the die sidewall MUF region 506B external sidewall506C may be at any angle, and may have any shape. For example, a slighttaper to the MUF region 506B external sidewall 506C may permit the mold502 to be more easily removed.

Package mounting studs 602 may optionally be applied to the packagemounts 204 in block 126, as shown in FIG. 6. In some embodiments, thepackage mounting studs 602 may be solid interconnects and may optionallybe disposed on the package mounts 204, and may be electrically connectedto, or in electrical communication with the lands 210 (FIG. 2). Byextension, the package mounting studs 602 may be in electricalcommunication with one or more through vias 218 in the interposersubstrate 206 (FIG. 2). The package mounting studs 602 may, in someembodiments, be wire attached, for example, by a wire bonding machine.

In another embodiment, the package mounting studs 602 may extend to atleast the height of the top surface of the die 402. Additionally, thepackage mounting studs 602 may be configured to accept a top package 702(not shown in FIG. 6, illustrated in FIG. 7) being mounted on them, withthe package mounting studs 602 retaining the top package 702 above thedie 402. The tops of package mounting studs 602 may be at a heightsufficient to permit a top package to be held separated over the die402, or with the top package in contact with the die 402.

An organic solderability preservative (OSP), or other solder-compatiblecoating may be applied in block 128. An anticorrosion coating such as asolderability preservative may be applied to the package mounting studs602, to the package mounts 204, or to both the package mounting studs602 and the package mounts 204. Alternatively, a coating not susceptibleto corrosion may be applied to the package mounting studs 602, thepackage mounts 204, or both. For example, a coating of gold (Au),palladium (Pd), nickel (Ni), alloys of the foregoing, or the like may beused over the package mounting studs 602 or the package mounts 204. AnOSP may be advantageous where a carrier package 200 is prepared orassembled prior to mounting a final assembly or top package 702 (FIG.7), as the OSP may protect or preserve the surface of a package mountingstud 602 or package mount 204 that may be prone to corrosion.

A top package 702 may be mounted in block 130 and the solder may bereflowed to attach the top package 702 to the carrier package 200 inblock 132. FIG. 7 illustrates a package-on-package device 700 with a toppackage 702 mounted on a carrier package 200 in accordance with variousembodiments of the present disclosure. In some embodiments, the toppackage 702 may be mounted at a height where the bottom surface of thetop package 702 is separated from the top surface of the die 402. In anembodiment where package mounting studs 602 are employed, the packagemounting studs 602 may be formed at a height sufficient to hold the toppackage separated from the top surface of the die 402. In anotherembodiment, the bottom surface of top package 702 may be in directcontact with the top surface of the die 402, or may have an adhesive,heat transfer compound or heat sink disposed between the top package 702and the top surface of the die 402.

In some embodiments, the top package 702 may have an interposersubstrate 206 with substrate lands 216 disposed on one or more sides ofthe interposer substrate to connect vias through the interposersubstrate 206. One or more package connectors 704 may be applied toconnect the top package 702 to the package mounting studs 602. In someembodiments, the package connectors 704 may be solder balls applied tosubstrate lands 216 on the bottom of the top package 702. In suchembodiments, the solder ball package connector 704 may be reflowed toattach the top package 702 to the package mounting studs 602, whereused. In other embodiments where a package mounting stud 602 is avoided,the top package 702 may attach directly to the package mounts 204. Inyet other embodiments, the package connectors 704 may be solder paste, aconductive adhesive, or the like.

A top package 702 may, in some embodiments, have one or more top dies706 attached via an adhesive 708 or other mounting technique. A top die706 may be electrically connected to one or more substrate lands 216 inthe interposer substrate 206 via a wire bond 710. In other embodiments,the top die 706 may be mounted to the top package 702 interposersubstrate 206 via a ball grid array on die lands 404, via a socket, viasurface mounting technology, or the like. The top die 706 may, in someembodiments, be in electrical communication with the carrier package 200via the package mounting studs 602, and the package mounts 204.

FIGS. 8A-8D illustrates a cross-sectional view of an embodiment forforming a carrier package 200 with a grooved MUF 506 according to thepresent disclosure. Package mounts 204 may be applied and die 402mounted, as shown in FIG. 8A and as described above with respect toFIGS. 2 and 4. As shown in FIG. 8B, the MUF 506 may be applied over thepackage mounts 204. In some embodiments, the MUF 506 may cover thepackage mounts 204, and may have a top surface substantially level withthe die 402. A mold 502 may be used to form or retain the MUF 506, andmay have a substantially planar molding surface used to form the topsurface of the MUF 506.

The MUF 506 and package mounts 204 may be grooved, as shown in FIG. 8C.Mounting grooves 802 may be formed through the MUF 506 and extendinginto a portion of the package mounts 204. A flat surface may be createdon, or within, the package mounts 204. In some embodiments, the mountinggrooves 802 are formed with a flat bottom surface. The bottom surface ofthe mounting grooves 802 may be disposed in the package mounts 204,resulting in a flat-bottomed recess in the package mounts 204. In someembodiments, the mounting grooves 802 may be formed via a mechanicalprocess, such as milling, sawing or drilling, or in other embodiments,via another suitable process.

As shown in FIG. 8D, package mounting studs 602 may optionally bedisposed within the mounting grooves 802. In some embodiments, thepackage mounting studs 602 may extend higher than the surface of the MUF506. The mounting grooves 802 may be configured so that a top package(702 of FIG. 7) may be mounted on the package mounting studs 602, andpackage connectors (704 of FIG. 7) may extend into the mounting grooves802 to attach the top package 702 to the package mounting studs 602.

FIGS. 9A-9D illustrate a cross-sectional view of an embodiment forforming a carrier package 200 with embedded package mounting structures902 according to the present disclosure. Package mounting structures 902may be applied to the lands 210 with solder paste 904, solder, oranother suitable conductive attachment process as shown in FIG. 9A. Insome embodiments, the package mounting structures 902 may be anon-fusible or non-solder metal such as copper. In other embodiments,the package mounting structures 902 may be any other suitable materialsuch as tungsten, gold, aluminum, tantalum, alloys of the same, or thelike. The package mounting structures 902 may be shaped as, for example,balls, posts, posts or the like.

A die 402 may be mounted, and a solder reflow process performed to affixthe die 402 to the die mounts 202 and package mounting structures 902 tothe lands 210, as shown in FIG. 9B. FIG. 9C illustrates formation of anMUF 506 around the package mounting structures 902 in accordance withvarious embodiments of the present disclosure. A contoured mold 906 mayhave one or more contoured recesses configured to conform to the packagemounting structures 902. The MUF 506 may be formed so that the packagemounting structures 902 extend beyond the MUF 506 surface in the regionsurrounding the package mounting structures 920.

FIG. 9D illustrates mounting a top package 702 on the package mountingstructures 902 in accordance with various embodiments of the presentdisclosure. One or more package connectors 704 may attach to theportions of the package mounting structures exposed or extending abovethe MUF 506 surface.

FIG. 10 illustrates a cross-sectional view of a carrier package 200 withan MUF 506 in accordance with various embodiments of the presentdisclosure. In the embodiment of FIG. 10, the package mounting studs 602may be applied to the package mounts 204 and the MUF 506 may be appliedto cover a base section of the package mounting studs 602 in the packagemount MUF region 506A. In some embodiments, at least a portion of thepackage mounting studs 602 extends above the top surface of the MUF 506.In other embodiments, the MUF 506 is applied to be substantially thesame level as the top surface of the die 402. In such embodiments, thetop surface of the die 402 may be substantially free of MUF 506material.

FIG. 11 illustrates a cross-sectional view of a carrier package 200 withan MUF 506 in accordance with various embodiments of the presentdisclosure. The package mounts 204 may extend to the top surface of theMUF 506, which may be applied to be substantially the same level as thetop surface of the die 402. In such embodiments, the package mountingstuds 602 may be eliminated, or, alternatively, may be applied onextended height package mounts 204.

FIG. 12 illustrates a cross-sectional view of a carrier package 200 withan MUF 506 in accordance with various embodiments of the presentdisclosure. The package mounts 204 may extend to the top surface of theMUF 506, which may be higher than the level of the top surface of thedie 402. In such embodiments the MUF may cover the die 402.

FIG. 13 illustrates a cross-sectional view of a carrier package 200 withan MUF 506 in accordance with various embodiments of the presentdisclosure. The package mounts 204 may extend to the top surface of theMUF 506, which may be higher than the level of the top surface of thedie 402 in the package mount MUF region 506A. The MUF 506 may be appliedso that the top surface of the die 402 is exposed. The die sidewall MUFregion 506B may, in some embodiments, slope from the package mount MUFregion 506A to the die 402, or may, alternatively, have a verticalsidewall transitioning from the package mount MUF region 506A to the die402. In some embodiments, the recessed MUF 506 exposing the die 402 topsurface may permit airflow over the die 402, application of a heatsinkor the like.

In an embodiment, a device is provided. The device includes a carrierpackage having at least one land, a package mount disposed on a firstside of the carrier package and in electrical communication with a landof the carrier package, a die mount disposed on the first side of thecarrier package, and a die mounted on the die mount. The device furtherincludes a molded underfill (MUF) disposed on the first side of thecarrier package, the MUF in contact with at least a portion of thepackage mount and in contact with at least a portion of a sidewall ofthe die, wherein the MUF comprises a package mount MUF region and a diesidewall MUF region, the die sidewall MUF region in contact with atleast a portion of the die sidewall and the package mount at leastpartially disposed within the package mount MUF region and wherein a topsurface of the package mount MUF region is at a different height than atop surface of the die sidewall MUF region.

In an embodiment, a device is provided. The device includes a carrierpackage having at least one land, a package mount disposed on a firstside of the carrier package and in electrical communication with a landof the carrier package, and a die disposed on the first side of thecarrier package. The device further includes a molded underfill (MUF)disposed on the first side of the carrier package and having at least apackage mount MUF region and a die sidewall MUF region, the die sidewallMUF region in contact with at least a portion of a die sidewall and thepackage mount at least partially disposed within the package mount MUFregion, the package mount not extending above an upper surface of thedie.

In an embodiment, a device is provided. The device includes a die mounton a first side of a carrier package, a package mount on the first sideof the carrier package, a top surface of the package mount having arecess, and a die mounted on the die mount. The device further includesa molded underfill (MUF) over the first side of the carrier package, theMUF being in contact with a sidewall of the die and extending above atopmost surface of the package mount, the molded underfill having anopening above the recess in the package mount.

Although embodiments of the present disclosure and their advantages havebeen described in detail, it should be understood that various changes,substitutions and alterations can be made herein without departing fromthe spirit and scope of the disclosure as defined by the appendedclaims. For example, it will be readily understood by those skilled inthe art that many of the features, functions, processes, and materialsdescribed herein may be varied while remaining within the scope of thepresent disclosure. Moreover, the scope of the present application isnot intended to be limited to the particular embodiments of the process,machine, manufacture, composition of matter, means, methods and stepsdescribed in the specification.

As one of ordinary skill in the art will readily appreciate from thedisclosure of the present disclosure, processes, machines, manufacture,compositions of matter, means, methods, or steps, presently existing orlater to be developed, that perform substantially the same function orachieve substantially the same result as the corresponding embodimentsdescribed herein may be utilized according to the present disclosure.Accordingly, the appended claims are intended to include within theirscope such processes, machines, manufacture, compositions of matter,means, methods, or steps.

What is claimed is:
 1. A device comprising: a carrier package having atleast one land; a package mount disposed on a first side of the carrierpackage and in electrical communication with a land of the carrierpackage; a die mount disposed on the first side of the carrier package;a die mounted on the die mount; and a molded underfill (MUF) disposed onthe first side of the carrier package, the MUF in contact with at leasta portion of the package mount and in contact with at least a portion ofa sidewall of the die, wherein the MUF comprises a package mount MUFregion and a die sidewall MUF region, the die sidewall MUF region incontact with at least a portion of the die sidewall and the packagemount at least partially disposed within the package mount MUF regionand wherein a top surface of the package mount MUF region is at adifferent height than a top surface of the die sidewall MUF region. 2.The device of claim 1, wherein the package mount has a substantiallyflat section opposite the carrier package.
 3. The device of claim 2,wherein the die mount has a substantially flat section opposite thecarrier package, and wherein the flat section of the package mount andthe flat section of the package mount are level.
 4. The device of claim1, wherein the top surface of the package mount MUF region is below atop surface of the die.
 5. The device of claim 1, wherein the topsurface of the package mount MUF region is above a top surface of thedie.
 6. The device of claim 1, further comprising a package mountingstud on the package mount, the package mounting stud extending above anuppermost surface of the MUF.
 7. The device of claim 1, furthercomprising a package mounted to the package mounting stud.
 8. The deviceof claim 7, further comprising a solder joint extending from the packagemounting stud to the package, the package mounting stud separating thepackage mount from the solder joint.
 9. A device comprising: a carrierpackage having at least one land; a package mount disposed on a firstside of the carrier package and in electrical communication with a landof the carrier package; a die disposed on the first side of the carrierpackage; and a molded underfill (MUF) disposed on the first side of thecarrier package and having at least a package mount MUF region and a diesidewall MUF region, the die sidewall MUF region in contact with atleast a portion of a die sidewall and the package mount at leastpartially disposed within the package mount MUF region, the packagemount not extending above an upper surface of the die.
 10. The device ofclaim 9 wherein the package mount has a substantially flat top sectionopposite the carrier package, the flat top section substantially levelwith a top surface of the package mount MUF region.
 11. The device ofclaim 9, further comprising a top package mounted to the package mounts,the top package disposed above the die.
 12. The device of claim 11,wherein a bottom surface of the top package is separated from a topsurface of the die.
 13. The device of claim 11, further comprising apackage mounting stud disposed on the package mount, the top packagedisposed on the package mounting stud and in electrical communicationwith the carrier package via the package mounting stud and the packagemount.
 14. A device comprising: a die mount on a first side of a carrierpackage; a package mount on the first side of the carrier package, a topsurface of the package mount having a recess; a die mounted on the diemount; and a molded underfill (MUF) over the first side of the carrierpackage, the MUF being in contact with a sidewall of the die andextending above a topmost surface of the package mount, the moldedunderfill having an opening above the recess in the package mount. 15.The device of claim 14, further comprising a package mounting studextending through the opening and contacting the package mount in therecess of the package mount.
 16. The device of claim 15, furthercomprising a package mounted to the package mounting stud.
 17. Thedevice of claim 16, wherein the package comprises a plurality of diesmounted on a package substrate.
 18. The device of claim 14, wherein theMUF contacts at least a portion of the top surface of the package mount.19. The device of claim 14, wherein an uppermost surface of the MUF islevel with an uppermost surface of the die.
 20. The device of claim 14,wherein the MUF extends between the carrier package and the die.